http://www.freshpatents.com/Electricity--measuring-and-testing-dtnewntc324.php USPTO Class 324 - Electricity: measuring and testing en-us Wed, 9 Jul 2008 07:38:26 -0700 1000 Wednesday Thursday Friday Saturday Sunday 141 31 http://www.freshpatents.com/index.php?rss=true http://www.freshpatents.com/images/freshpatentsnav_rss.gif http://www.freshpatents.com/Method-and-receiver-for-estimating-dc-offset-dt20080703ptan20080157749.php Wed, 9 Jul 2008 07:38:26 -0700 A method for estimating a DC offset in a received signal, the method comprising: detecting a plurality of zero crossings of the signal (220); determining a variable time window (235) based upon a predetermined number of said detected zero crossings (230); estimating the DC offset (240) of the signal in... http://www.freshpatents.com/Method-and-apparatus-for-measuring-terahertz-time-domain-spectroscopy-dt20080703ptan20080157750.php Wed, 9 Jul 2008 07:38:26 -0700 Disclosed are a method and an apparatus for measuring terahertz time-domain spectrum, which relate to the field of terahertz time-domain spectrum. The method comprises the steps of: generating a first pulse laser beam from a first femtosecond laser device at a preset repetition frequency to generate THz pulses; generating a... http://www.freshpatents.com/Current-sensing-apparatus-dt20080703ptan20080157751.php Wed, 9 Jul 2008 07:38:26 -0700 Disclosed is a current sensing apparatus which includes a first current transformer that, when energized, has a first input current and a first output current, the first output current being less than the first input current, the first current transformer stepping down the current. The current sensing apparatus includes a... http://www.freshpatents.com/Current-sensor-and-method-for-motor-control-dt20080703ptan20080157752.php Wed, 9 Jul 2008 07:38:26 -0700 The present invention provides an improved motor current sensor and methods thereof. A first embodiment of the present invention provides a circuit having a signal transfer unit for receiving first and second input signals from opposing terminals of a shunt resistor and a signal conditioner unit for conditioning output signals... http://www.freshpatents.com/System-and-method-for-determining-the-performance-of-an-on-chip-interconnection-network-dt20080703ptan20080157753.php Wed, 9 Jul 2008 07:38:26 -0700 This system for determining the performance of an interconnection network of functional blocks of a specialized integrated circuit, comprises a set of probing modules disposed on the network and comprising means for detecting an event on at least one communication link of the network and means for determining a characteristic... http://www.freshpatents.com/Correction-of-measured-values-for-a-magnetic-localization-device-dt20080703ptan20080157755.php Wed, 9 Jul 2008 07:38:26 -0700 The invention relates to a device and a method for correction of the position (x) of a field sensor (4) measured by means of a magnetic localization device. External field distortions, such as caused for example by the rotating components (1a, 1b) of a computer tomograph (1), are then determined... http://www.freshpatents.com/Inductive-position-measuring-device-or-goniometer-dt20080703ptan20080157756.php Wed, 9 Jul 2008 07:38:26 -0700 The invention relates to an inductive position measuring device or goniometer having two to no more than five digital oscillators, each of which contains measuring coils or reference coils. Particularly favorable for one application as a transmission sensor is a coil array for three or four oscillators that includes two... http://www.freshpatents.com/Magnetic-path-monitor-dt20080703ptan20080157757.php Wed, 9 Jul 2008 07:38:26 -0700 A motion sensor which has a coil that surrounds a ferromagnetic core and at least one magnet that is longitudinally movable along the coil. The magnet causes a magnetic saturation of the ferromagnetic core in an associated zone that covers a portion of the length of the coil. An evaluation... http://www.freshpatents.com/Swivel-portable-terminal-dt20080703ptan20080157754.php Wed, 9 Jul 2008 07:38:26 -0700 Provided is a swivel portable terminal. The swivel portable terminal is configured to allow first and second magnet detecting units installed at one body of a main body and a swivel body at a predetermined interval therebetween to detect first and second magnets installed at the other body and corresponding... http://www.freshpatents.com/Magnetic-error-proofing-of-sensors-dt20080703ptan20080157758.php Wed, 9 Jul 2008 07:38:26 -0700 A magnet's N and S polarity can be alternately assembled within a MR sensor housing to determine the type of sensor that is assembled. In an MR sensor package including a housing having a sensing face and adapted for containing a sensing transducer and magnet, it can be determined if... http://www.freshpatents.com/Combined-sensor-and-bearing-assembly-dt20080703ptan20080157759.php Wed, 9 Jul 2008 07:38:26 -0700 A combined sensor and bearing assembly including a rolling bearing unit and a rotation sensor unit. The rolling bearing unit is made up of a rotatable raceway member, a stationary raceway member and at least one row of rolling elements. The rotation sensor unit includes a to-be-detected member having a... http://www.freshpatents.com/System-and-method-for-hard-drive-component-testing-dt20080703ptan20080157760.php Wed, 9 Jul 2008 07:38:26 -0700 Embodiments of the present invention include a method and System for Hard Drive component testing, particularly for magnetic recording head testing. The method of testing magnetic recording heads includes: performing a magnetic write width test (on a plurality of disk drive heads), sorting the plurality of heads into a first... http://www.freshpatents.com/Method-and-apparatus-for-calibrating-a-gradiometer-dt20080703ptan20080157761.php Wed, 9 Jul 2008 07:38:26 -0700 A magnetic screening system uses directional gradiometers with high resolution and accuracy to measure magnetic field signatures of target objects (e.g., gun, knife, cell phone, keys) in a volume of interest. The measured signatures can be compared to signatures of known objects stored in a local database. Various mathematical processes... http://www.freshpatents.com/Optical-decoupling-tuning-and-shimming-of-magnetic-resonance-coils-dt20080703ptan20080157762.php Wed, 9 Jul 2008 07:38:26 -0700 A magnetic resonance imaging system (10) includes a transmit coil (22) and one or more receive coils (32). The transmit coil includes one or more circuit segments (44, 44, 80, 90) including a light-sensitive metal-insulator-semiconductor capacitor (50) which is connected by an optic fiber to one of a plurality of... http://www.freshpatents.com/Mr-data-acquisition-method-mr-image-construction-method-and-mri-system-dt20080703ptan20080157763.php Wed, 9 Jul 2008 07:38:26 -0700 An MR data acquisition method for acquiring data D_φfat according to a steady-state pulse sequence specifying that a phase of an RF pulse is varied in order of 0, 1×φfat, 2×φfat, etc., wherein φfat=(2−TR/T_out+2×m)×π is established on an assumption that m denotes an integer equal to or larger than 0... http://www.freshpatents.com/Magnetic-resonance-imaging-apparatus-and-magnetic-resonance-image-data-processing-method-dt20080703ptan20080157766.php Wed, 9 Jul 2008 07:38:26 -0700 A magnetic resonance imaging apparatus 20 includes a phase difference calculation unit 44 configured to perform a one-dimensional Fourier transform on complex data not phase-encoded extracted from complex data of a nuclear resonant signal collected by dynamic scanning, and determining a phase difference in time of data obtained by performing... http://www.freshpatents.com/Magnetic-resonance-imaging-apparatus-magnetic-resonance-imaging-method-and-diffusion-tensor-color-map-image-generating-apparatus-dt20080703ptan20080157764.php Wed, 9 Jul 2008 07:38:26 -0700 A magnetic resonance imaging apparatus for generating an image related to a radiographing area of a subject on the basis of a magnetic resonance signal produced in the radiographing area within a static magnetic field space, the magnetic resonance imaging apparatus includes: a fiber tracking device for tracking a running... http://www.freshpatents.com/Method-and-device-for-monitoring-radio-frequency-exposure-in-a-magnetic-resonance-measurement-dt20080703ptan20080157765.php Wed, 9 Jul 2008 07:38:26 -0700 In a method and device for monitoring the physiologically effective radio-frequency exposure in at least one specific volume region of an examination subject in a magnetic resonance data acquisition scan in a magnetic resonance system, the magnetic resonance system having a radio-frequency antenna structure with a number of individually controllable... http://www.freshpatents.com/Mri-data-acquisition-using-propeller-k-space-data-acquisition-dt20080703ptan20080157767.php Wed, 9 Jul 2008 07:38:26 -0700 Disclosed is a new propeller EPI pulse sequence with reduced sensitivity to field inhomogeneities is proposed. Image artifacts such as blurring due to Nyquist ghosting and susceptibility gradients are investigated and compared with those obtained in previous propeller EPI studies. The proposed propeller EPI sequence uses a readout that is... http://www.freshpatents.com/Dual-tuned-tem-birdcage-hybrid-volume-coil-for-human-brain-and-spectroscopy-dt20080703ptan20080157770.php Wed, 9 Jul 2008 07:38:26 -0700 A dual-tuned hybrid resonator coil for high field multinuclear MRI/MRS combines both the TEM and the BC designs, such that the mode splitting is significantly increased. The coil includes TEM elements and BC coil windows, where the TEM elements are positioned in each of the windows and oriented orthogonally thereto.... http://www.freshpatents.com/Open-coil-for-magnetic-resonance-imaging-dt20080703ptan20080157768.php Wed, 9 Jul 2008 07:38:26 -0700 This document discusses, among other things, a system and method for a coil having a plurality of resonant elements with one or more openings between elements. In some instances, resonant elements are spaced such that an opening is defined between each pair of adjacent resonant elements. An impedance is coupled... http://www.freshpatents.com/Whole-body-antenna-with-microwave-elements-and-magnetic-resonance-system-embodying-same-dt20080703ptan20080157769.php Wed, 9 Jul 2008 07:38:26 -0700 A whole-body antenna for a magnetic resonance system has an antenna structure including at least one antenna rod extending in a longitudinal direction. The antenna rod can be charged with a transmission current to cause an excitation signal to be emitted that causes magnetic resonance signals to be excited in... http://www.freshpatents.com/Superconducting-magnet-configuration-with-reduced-heat-input-in-the-low-temperature-regions-dt20080703ptan20080157771.php Wed, 9 Jul 2008 07:38:26 -0700 The invention concerns a magnet configuration comprising a superconducting magnet coil (1) within which a gradient system is to be switched. All low temperature oscillation systems (R1) with a temperature T1<10K within the magnet coil (1) are produced from a material having good electrical conducting properties, and at least one... http://www.freshpatents.com/Radio-frequency-coil-assembly-and-magnetic-resonance-imaging-apparatus-dt20080703ptan20080157772.php Wed, 9 Jul 2008 07:38:26 -0700 A radio frequency coil assembly is provided. The radio frequency coil assembly includes: a first radio frequency coil for receiving a magnetic resonance signal from a tested body; a second radio frequency coil for receiving a magnetic resonance signal from the tested body; and a third radio frequency coil for... http://www.freshpatents.com/Method-and-apparatus-for-use-of-the-real-component-of-a-magnetic-field-of-multicomponent-resistivity-measurements-dt20080703ptan20080157773.php Wed, 9 Jul 2008 07:38:26 -0700 Multi-component induction measurements are made using a resistivity logging tool in an anistropic earth formation. A subset of the multi-component measurements are inverted to first determine horizontal resistivities. Using the determined horizontal resistivities and another subset of the multi-component measurements, the vertical resistivities are obtained. Results of using the in-phase... http://www.freshpatents.com/Method-for-testing-an-electronic-circuit-for-driving-a-dc-motor-dt20080703ptan20080157774.php Wed, 9 Jul 2008 07:38:26 -0700 The present invention relates to a method for testing an electronic circuit comprising a plurality of switching elements arranged in a H-bridge configuration, the electronic circuit being adapted to drive an associated DC-motor operatively connected to the H-bridge, the DC-motor being adapted to move an associated piston rod in an... http://www.freshpatents.com/Relay-device-and-corresponding-method-dt20080703ptan20080157775.php Wed, 9 Jul 2008 07:38:26 -0700 The invention consists of a relay device including: at least one mode change device for changing the relay device from a normal mode to a test mode; an interface for receiving test script from a source; a waveform generator for running the test script received from the source and outputting... http://www.freshpatents.com/Measurement-of-analog-coil-voltage-and-coil-current-dt20080703ptan20080157776.php Wed, 9 Jul 2008 07:38:26 -0700 A monitor circuit is provided which detects various incipient failure modes of a circuit breaker. The monitor circuit includes a processor and a primary circuit connected in circuit with the processor. The primary circuit may be configured for preventing transients and high currents associated with the operation of the circuit... http://www.freshpatents.com/Electromotive-force-computing-device-and-state-of-charge-estimating-device-dt20080703ptan20080157777.php Wed, 9 Jul 2008 07:38:26 -0700 Error in an electromotive force Ve of a secondary battery calculated on the basis of a polarized voltage Vp is reduced. A polarized voltage computing section acquires multiple data pairs of a current I flowing to the secondary battery and a terminal voltage V of the secondary battery with respect... http://www.freshpatents.com/Estmation-method-device-and-electronic-system-utilizing-the-same-dt20080703ptan20080157778.php Wed, 9 Jul 2008 07:38:26 -0700 An estimation method for estimating a remaining capacity of a battery utilized by an electronic system is disclosed. The voltage of the battery is detected or is determined by a first reference value. When the duration of a specific state arrives at a preset time, a specific action is executed.... http://www.freshpatents.com/Prismatic-battery-short-circuit-inspection-method-prismatic-battery-manufacturing-method-and-current-collector-shape-adjusting-device-dt20080703ptan20080157779.php Wed, 9 Jul 2008 07:38:26 -0700 An object of the present invention is to easily detect a short circuit failure in a current collector of a prismatic battery and prevent a short circuit caused by an existence of a burr generated while cutting or a spatter generated while welding the current collector to an electrode plate.... http://www.freshpatents.com/Location-of-high-resistance-ground-faults-on-buried-power-cables-dt20080703ptan20080157780.php Wed, 9 Jul 2008 07:38:26 -0700 The location of high resistance ground faults within buried co-axial power cables can be detected by transmitting a combined signal along the cable at a primary frequency of 0.718 Hz and a primary amplitude in the order of 4,500 volts peak to peak, This combined signal also has an interlocked... http://www.freshpatents.com/Methods-and-systems-for-detecting-series-arcs-in-electrical-systems-dt20080703ptan20080157781.php Wed, 9 Jul 2008 07:38:26 -0700 A method of detecting a series arc in an alternating current electrical system is provided. The method is a pattern-recognition based approach and includes passing raw current signals from a conductor in the electrical system through one or more filters to provide a filtered signal; extracting one or more features... http://www.freshpatents.com/Analog-boundary-scanning-based-on-stray-capacitance-dt20080703ptan20080157782.php Wed, 9 Jul 2008 07:38:26 -0700 Embodiments of the present invention are directed to performing boundary scanning without using a pin which is exclusively dedicated for that purpose. The boundary scan can be performed by an integrated circuit by utilizing a pin which has an alternative use during ordinary operation of the integrated circuit and the... http://www.freshpatents.com/Apparatus-and-method-for-monitoring-high-voltage-capacitors-dt20080703ptan20080157783.php Wed, 9 Jul 2008 07:38:26 -0700 State of a high voltage capacitor is monitored to detect partial discharge within the capacitor and approaching end-of-life of the capacitor. Partial discharge may be detected through an increased capacitance of the capacitor, and the resulting increase in the alternating current through the capacitor. Partial discharge may also be detected... http://www.freshpatents.com/Detection-of-the-supply-state-of-a-load-supplied-by-a-variable-voltage-dt20080703ptan20080157784.php Wed, 9 Jul 2008 07:38:26 -0700 A method and a circuit for detecting the state of supply of a load by a variable voltage, including measuring the difference between values representative of the variable supply voltage and of a voltage across the load.... http://www.freshpatents.com/Method-for-determining-the-state-of-a-spatially-extended-body-dt20080703ptan20080157785.php Wed, 9 Jul 2008 07:38:26 -0700 The invention relates to a long body, for example a gas-insulated electric line (1), the condition of which is tested by an electronic signal that is supplied to the body and then received by a receiver unit. The electronic signal has a predefined duration and form. The receiver unit receives... http://www.freshpatents.com/Quality-control-methods-for-the-manufacture-of-polymer-arrays-dt20080703ptan20080157786.php Wed, 9 Jul 2008 07:38:26 -0700 Described are quality control methods and devices for the reproducible manufacturing and integrity monitoring of polymers on electrochemical synthesis and detection chips. The devices and methods allow for simultaneous manufacturing and synthesis of polymers.... http://www.freshpatents.com/Sensitivity-capacitive-sensor-dt20080703ptan20080157787.php Wed, 9 Jul 2008 07:38:26 -0700 A method of creating an improved sensitivity capacitive fingerprint sensor involves forming vias from a first side of a sensor chip having an array of capacitive sensors, making the vias electrically conductive, and attaching a cover plate over the first side of the sensor chip spaced from the sensor chip... http://www.freshpatents.com/System-and-method-for-testing-voltage-endurance-dt20080703ptan20080157788.php Wed, 9 Jul 2008 07:38:26 -0700 A method for testing voltage endurance of a electronic component, includes: generating an oscillating signal; amplifying the oscillating signal; transforming the amplified oscillating signal to generate a transformed signal; blocking a negative voltage of the transformed signal to generate a test signal to be transmitted to the electronic component; and... http://www.freshpatents.com/Probe-card-and-method-of-manufacturing-the-same-dt20080703ptan20080157792.php Wed, 9 Jul 2008 07:38:26 -0700 A probe card includes a first micro probe head (MPH), a second MPH, and needles. The first MPH includes first conductive traces into which a test signal for testing an object having outer terminals is inputted. The second MPH includes second conductive traces electrically connected to the first conductive traces,... http://www.freshpatents.com/Probe-head-having-a-membrane-suspended-probe-dt20080703ptan20080157795.php Wed, 9 Jul 2008 07:38:26 -0700 A probe head with membrane suspended probes.... http://www.freshpatents.com/Probe-unit-substrate-dt20080703ptan20080157794.php Wed, 9 Jul 2008 07:38:26 -0700 A ceramic substrate has, on its surface, a multilayer wiring division, on which micro cantilever type probes are fixed. The multilayer wiring division has the first conductor layer, which includes through-hole junction pads, flatness improvement rings surrounding the through-hole junction pads and a grounding region further surrounding the flatness improvement... http://www.freshpatents.com/Rotating-contact-element-and-methods-of-fabrication-dt20080703ptan20080157789.php Wed, 9 Jul 2008 07:38:26 -0700 Rotating contact elements and methods of fabrication are provided herein. In one embodiment, a rotating contact element includes a tip having a first side configured to contact a device to be tested and an opposing second side; and a plurality of deformed members extending from the second side of the... http://www.freshpatents.com/Stiffener-assembly-for-use-with-testing-devices-dt20080703ptan20080157790.php Wed, 9 Jul 2008 07:38:26 -0700 A stiffener assembly for use with testing devices is provided herein. In some embodiments, a stiffener for use with testing devices includes an inner member; an outer member disposed in a predominantly spaced apart relation to the inner member; and a plurality of alignment mechanisms for orienting the inner and... http://www.freshpatents.com/Stiffener-assembly-for-use-with-testing-devices-dt20080703ptan20080157791.php Wed, 9 Jul 2008 07:38:26 -0700 A stiffener assembly for use with testing devices is provided herein. In some embodiments, a stiffener assembly for use with testing devices can be part of a probe card assembly that can include a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and a substrate... http://www.freshpatents.com/Vertical-microprobes-for-contacting-electronic-components-and-method-for-making-such-probes-dt20080703ptan20080157793.php Wed, 9 Jul 2008 07:38:26 -0700 Multilayer probe structures for testing or otherwise making electrical contact with semiconductor die or other electronic components are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments the structures may include configurations intended to enhance functionality, buildability, or both.... http://www.freshpatents.com/Chuck-with-integrated-wafer-support-dt20080703ptan20080157796.php Wed, 9 Jul 2008 07:38:26 -0700 An improved chuck with lift pins within a probe station.... http://www.freshpatents.com/Probe-probe-card-and-testing-device-dt20080703ptan20080157797.php Wed, 9 Jul 2008 07:38:26 -0700 An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for performing a... http://www.freshpatents.com/On-die-heating-circuit-and-control-loop-for-rapid-heating-of-the-die-dt20080703ptan20080157798.php Wed, 9 Jul 2008 07:38:26 -0700 An integrated circuit includes a heating circuit configured to heat the integrated circuit under the control of a controller. A transfer function with adjustable pole, zero and overall gain is implemented in the controller such that a temperature response of the integrated circuit can be changed by adjusting one or... http://www.freshpatents.com/Resilient-contact-element-and-methods-of-fabrication-dt20080703ptan20080157799.php Wed, 9 Jul 2008 07:38:26 -0700 Embodiments of resilient contact elements and methods for fabricating same are provided herein. In one embodiment, a resilient contact element for use in a probe card includes a lithographically formed resilient beam having a first end and an opposing second end; and a tip disposed proximate the first end of... http://www.freshpatents.com/Carrier-module-for-adapting-non-standard-instrument-cards-to-test-systems-dt20080703ptan20080157804.php Wed, 9 Jul 2008 07:38:26 -0700 A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a single carrier module. The carrier module is then plugged into the test head of the test system. The carrier... http://www.freshpatents.com/Carrier-module-for-adapting-non-standard-instrument-cards-to-test-systems-dt20080703ptan20080157805.php Wed, 9 Jul 2008 07:38:26 -0700 A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a single carrier module. The carrier module is then plugged into the test head of the test system. The carrier... http://www.freshpatents.com/Characterization-of-micromirror-devices-using-reset-drivers-dt20080703ptan20080157801.php Wed, 9 Jul 2008 07:38:26 -0700 An array of individually addressable micromirrors is characterized by sending a driving signal to a pixel group having a fewer number of micromirrors. A response of the micromirrors in the group is measured; and the micromirror array is characterized based upon at least the measured response.... http://www.freshpatents.com/Die-testing-using-top-surface-test-pads-dt20080703ptan20080157803.php Wed, 9 Jul 2008 07:38:26 -0700 Timely testing of die on wafer reduces the cost to manufacture ICs. This disclosure describes a die test structure and process to reduce test time by adding test pads on the top surface of the die. The added test pads allow a tester to probe and test more circuits within... http://www.freshpatents.com/Direct-detect-sensor-for-flat-panel-displays-dt20080703ptan20080157802.php Wed, 9 Jul 2008 07:38:26 -0700 Each sensor of a linear array of sensors includes, in part, a sensing electrode and an associated feedback circuit. The sensing electrodes are adapted to be brought in proximity to a flat panel having formed thereon a multitude of pixel electrodes in order to capacitively measure the voltage of the... http://www.freshpatents.com/Teg-pattern-and-method-for-testing-semiconductor-device-using-the-same-dt20080703ptan20080157800.php Wed, 9 Jul 2008 07:38:26 -0700 A TEG pattern comprises: a plurality of device isolation layer patterns having a predetermined gap; an active area pattern between adjacent device isolation layer patterns; and metal 1 contact patterns in the active region pattern.... http://www.freshpatents.com/Picker-for-use-in-a-handler-and-method-for-enabling-the-picker-to-place-packaged-chips-dt20080703ptan20080157807.php Wed, 9 Jul 2008 07:38:26 -0700 Provided is a picker for use in a handler, including at least one picker base, a row of nozzles provided to each of the picker base, and a detecting unit, provided to one side of each of the nozzle, for detecting if a packaged chip exists in a carrying hole... http://www.freshpatents.com/Test-socket-for-semiconductor-dt20080703ptan20080157806.php Wed, 9 Jul 2008 07:38:26 -0700 The present invention relates to a test socket for a semiconductor device, which may correspond to a narrow pitch of terminal interval and high speed test in a simplified structure, thereby reducing manufacturing cost thereof. The test socket for a semiconductor device includes conductive substrates having contact point parts exposed... http://www.freshpatents.com/Wafer-level-burn-in-and-test-dt20080703ptan20080157808.php Wed, 9 Jul 2008 07:38:26 -0700 Techniques for performing wafer-level burn-in and test of semiconductor devices include a test substrate having active electronic components such as ASICs mounted to an interconnection substrate or incorporated therein, metallic spring contact elements effecting interconnections between the ASICs and a plurality of devices-under-test (DUTs) on a wafer-under-test (WUT), all disposed... http://www.freshpatents.com/Display-panel-and-short-circuit-detection-device-thereof-dt20080703ptan20080157809.php Wed, 9 Jul 2008 07:38:26 -0700 A pixel unit including a pixel electrode, a scan electrode, a common voltage electrode, a data electrode and at least one redundancy electrode is provided. During the fabricating process of the pixel unit, if a particle is simultaneously located between any two of the pixel electrode, the scan electrode and... http://www.freshpatents.com/Method-for-testing-liquid-crystal-display-panels-dt20080703ptan20080157810.php Wed, 9 Jul 2008 07:38:26 -0700 A method for testing a liquid crystal display panel is provided. The gate drivers are integrated onto the panel. The method includes simultaneously inputting a clock signal, an inverted clock signal, and a pull down signal into clock signal, inverted clock signal, and pull down signal input ends of the...