http://www.freshpatents.com/Optics--measuring-and-testing-dtnewntc356.php USPTO Class 356 - Optics: measuring and testing en-us Fri, 19 Dec 2008 00:09:43 -0800 1000 Wednesday Thursday Friday Saturday Sunday 141 31 http://www.freshpatents.com/index.php?rss=true http://www.freshpatents.com/images/freshpatentsnav_rss.gif http://www.freshpatents.com/High-frequency-electrical-signal-control-device-and-sensing-system-dt20081211ptan20080304038.php Fri, 19 Dec 2008 00:09:43 -0800 A high frequency electrical signal control device comprises a transmitter for generating a high frequency electrical signal, a receiver, a transmission line for propagating the electrical signal, and a structure for radiating the electrical signal propagated through the transmission line to the space or receiving a signal from the space.... http://www.freshpatents.com/Cargo-dimensional-and-weight-analyzing-system-dt20081211ptan20080304040.php Fri, 19 Dec 2008 00:09:43 -0800 A laser scanner apparatus is disclosed herein for measuring the geometry and physical dimensions of one or more objects in a specified location or platform. The specified location or platform is within a range less than a predetermined maximum object distance. The laser scanner includes a waveform generator that generates... http://www.freshpatents.com/Measuring-system-dt20081211ptan20080304041.php Fri, 19 Dec 2008 00:09:43 -0800 A measuring system, comprising a surveying instrument for projecting a laser beam by rotary irradiation and a photodetection sensor device installed at a measuring point, wherein the surveying instrument comprises a first radio communication unit, the photodetection sensor device comprises a second radio communication unit, and communication can be performed... http://www.freshpatents.com/Distance-speed-meter-and-distance-speed-measuring-method-dt20081211ptan20080304042.php Fri, 19 Dec 2008 00:09:43 -0800 In a distance/speed meter, first and second semiconductor lasers emit parallel laser light beams to a measurement target. A first laser driver drives the first semiconductor laser such that the oscillation interval in which at least the oscillation wavelength monotonically increases repeatedly exists. A second laser driver drives the second... http://www.freshpatents.com/Sensor-array-and-sensor-device-for-a-sensor-array-dt20081211ptan20080304039.php Fri, 19 Dec 2008 00:09:43 -0800 The invention proposes a sensor array having a plurality of sensor devices comprising a source of electromagnetic radiation, a receiver for the electromagnetic radiation and a control device, the control device being designed to use the source to emit electromagnetic radiation and being designed to determine a distance covered by... http://www.freshpatents.com/Single-channel-heterodyne-distance-measuring-method-dt20081211ptan20080304043.php Fri, 19 Dec 2008 00:09:43 -0800 According to the invention, high precision distance measurement may be carried out by the broadcast of pulsed electromagnetic radiation (ES) with at least two pulse repetition frequencies, whereby the pulse repetition frequencies are selected such that the corresponding pulse separations do not have a common multiple in the range of... http://www.freshpatents.com/High-resolution-three-dimensional-imaging-radar-dt20081211ptan20080304044.php Fri, 19 Dec 2008 00:09:43 -0800 A three-dimensional imaging radar operating at high frequency e.g., 670 GHz, is disclosed. The active target illumination inherent in radar solves the problem of low signal power and narrow-band detection by using submillimeter heterodyne mixer receivers. A submillimeter imaging radar may use low phase-noise synthesizers and a fast chirper to... http://www.freshpatents.com/Motion-measurement-and-synchronication-using-a-scanning-interferometer-with-gratings-dt20081211ptan20080304045.php Fri, 19 Dec 2008 00:09:43 -0800 Indicating relative speed is disclosed. A first grating coupled to a first moving object is illuminated using a coherent light source to generate a first diffracted beam and a diffracted order beam. A second grating coupled to a second moving object is illuminated using the first diffracted beam and the... http://www.freshpatents.com/Imaging-apparatus-for-infrared-rays-nonlinear-molecular-vibrational-microscopy-dt20081211ptan20080304046.php Fri, 19 Dec 2008 00:09:43 -0800 The present invention relates to an imaging apparatus for infrared rays nonlinear molecular vibrational microscopy. The imaging apparatus comprises a pump beam source for generating an infrared pump beam; a probe beam source for generating a probe beam; a beam combiner which synchronizes temporally and overlaps spatially the pump beam... http://www.freshpatents.com/Imaging-apparatus-for-ir-four-wave-mixing-polarization-microscopy-dt20081211ptan20080304047.php Fri, 19 Dec 2008 00:09:43 -0800 The present invention relates to an imaging apparatus for IR four-wave mixing polarization microscopy. The imaging apparatus comprises a pump beam source for generating an infrared pump beam; a probe beam source for generating a probe beam (search beam); a polarizer for linearly polarizing the pump beam and probe beam;... http://www.freshpatents.com/Methods-and-apparatus-for-measuring-the-concentration-of-a-substance-in-a-solution-dt20081211ptan20080304048.php Fri, 19 Dec 2008 00:09:43 -0800 The present invention relates to methods and apparatus for detecting and measuring the concentration of a substance in a solution, the substance having an absorption at 300 nm or less. The methods and apparatus have particular utility in detecting and measuring the concentration of proteins and nucleic acids.... http://www.freshpatents.com/Goniophotometer-dt20081211ptan20080304049.php Fri, 19 Dec 2008 00:09:43 -0800 A goniophotometer includes two independent towers: a main support tower and an upright mirror tower. A swing arm is connected to the main support tower and can be rotated around a main horizontal axis. An elliptic flat rotation mirror, a first detector and a second detector are fixed to the... http://www.freshpatents.com/Stage-apparatus-exposure-apparatus-and-device-fabrication-method-dt20081211ptan20080304050.php Fri, 19 Dec 2008 00:09:43 -0800 A stage apparatus comprising a first stage and second stage configured to be able to move between a first area and second area on a stage moving surface of a base, a first mirror and second mirror arranged on the first stage and second stage, respectively, to measure positions of... http://www.freshpatents.com/Inspecting-end-surfaces-of-fiber-optic-connectors-dt20081211ptan20080304051.php Fri, 19 Dec 2008 00:09:43 -0800 A system for inspecting the end faces of fiber optic connectors includes a fixture holding a plurality of fiber optic connectors. The system also includes an inspection device configured to inspect end faces of each of the fiber optic connectors, the inspection device including a movement device to which the... http://www.freshpatents.com/Plasma-shunting-apparatus-and-method-for-ring-laser-gyroscope-dt20081211ptan20080304052.php Fri, 19 Dec 2008 00:09:43 -0800 A ring laser gyroscope includes a first plasma shunt arranged to prevent the plasma from contacting a first mirror in the gain region and a second plasma shunt arranged to prevent the plasma from contacting a second mirror in the gain region. The first and second plasma shunts may comprise... http://www.freshpatents.com/Apparatus-and-method-for-coating-and-inspecting-objects-dt20081211ptan20080304053.php Fri, 19 Dec 2008 00:09:43 -0800 An apparatus and method for inspecting objects for an inspection criteria thereon includes a conveyor to receive a plurality of objects, a removal assembly located along the conveyor for removing the objects, and an inspection system located along the conveyor prior to the removal assembly for inspecting the objects against... http://www.freshpatents.com/Method-for-analyzing-an-integrated-circuit-apparatus-and-integrated-circuit-dt20081211ptan20080304054.php Fri, 19 Dec 2008 00:09:43 -0800 A method for analyzing an integrated circuit (IC) comprising a plurality of semiconductor devices is disclosed. The method comprises the steps of forming a diffraction lens (100) comprising a plurality of concentric diffraction zones (110) in a first area of a further surface opposite to the first surface of the... http://www.freshpatents.com/Coordinate-measuring-machine-and-method-for-structured-illumination-of-substrates-dt20081211ptan20080304058.php Fri, 19 Dec 2008 00:09:43 -0800 A coordinate measuring machine (1) for the structured illumination of substrates is disclosed. The incident light illumination means (14) and/or the transmitted light illumination means (6) have a pupil access via which at least one optical element (35, 88) is positionable in the optical illumination path (4, 5). The size... http://www.freshpatents.com/Methods-for-detecting-and-classifying-defects-on-a-reticle-dt20081211ptan20080304056.php Fri, 19 Dec 2008 00:09:43 -0800 Methods for detecting and classifying defects on a reticle are provided. One method includes acquiring images of the reticle at first and second conditions during inspection of the reticle. The first condition is different than the second condition. The method also includes detecting the defects on the reticle using one... http://www.freshpatents.com/Surface-defect-inspection-method-and-apparatus-dt20081211ptan20080304055.php Fri, 19 Dec 2008 00:09:43 -0800 A surface defect inspection apparatus is structured to add detection signals of multi-directionally detected scattered lights to detect a tiny defect and to individually process the respective detection signals to prevent an error failing to detect an anisotropic defect.... http://www.freshpatents.com/System-and-method-for-controlling-light-scattered-from-a-workpiece-surface-in-a-surface-inspection-system-dt20081211ptan20080304057.php Fri, 19 Dec 2008 00:09:43 -0800 In one embodiment, a surface analyzer system comprises a radiation targeting assembly to target a radiation beam onto a surface; and a scattered radiation collecting assembly that collects radiation scattered from the surface. The radiation targeting assembly generates primary and secondary beams. Data collected from the reflections of the primary... http://www.freshpatents.com/High-sensitivity-method-for-detecting-differences-between-the-physically-measurable-properties-of-a-sample-and-a-reference-dt20081211ptan20080304059.php Fri, 19 Dec 2008 00:09:43 -0800 A method for detecting differences between physically measurable properties of a sample and a reference sample. A two-dimensional reference field is generated and first and second two-dimensional patterns are produced respectively from the reference sample and the sample. A correction is made to sample response functions to eliminate time-dependent and... http://www.freshpatents.com/Microstructures-method-for-producing-microstructures-and-optical-field-amplifying-device-dt20081211ptan20080304060.php Fri, 19 Dec 2008 00:09:43 -0800 A microstructure is formed on a conductor. The microstructure is equipped with a dielectric base material, in which a great number of fine holes having substantially the same shape in plan view are formed. The fine holes are open at the surface of the dielectric base material, and are substantially... http://www.freshpatents.com/Polarimetric-raman-system-and-method-for-analysing-a-sample-dt20081211ptan20080304061.php Fri, 19 Dec 2008 00:09:43 -0800 A Raman method and system for analysing a sample including an excitation source emitting an incident light beam, a sample holder for mounting the sample, elements for focusing the incident light beam onto the sample surface to generate a Raman scattered light having an intensity, elements for collecting the Raman... http://www.freshpatents.com/System-and-process-for-sorting-biological-particles-dt20081211ptan20080304062.php Fri, 19 Dec 2008 00:09:43 -0800 A system which irradiates light onto a liquid flow containing a biological particle, detects the light therefrom to collect biological information thereon, and sorts the biological particle based upon the biological information, comprises an optical detector for detecting the light from the biological particle; an imaging device for imaging the... http://www.freshpatents.com/Alignment-apparatus-control-method-thereof-exposure-apparatus-and-method-of-manufacutring-semiconductor-device-by-exposure-apparatus-controlled-by-the-same-control-method-dt20081211ptan20080304064.php Fri, 19 Dec 2008 00:09:43 -0800 An apparatus including a stage configured to be moved. A first laser interferometer measures a position of the stage in a first direction. A second laser interferometer measures a position of the stage in the first direction. A control unit (i) obtains a position of the stage based on an... http://www.freshpatents.com/Overlay-mark-and-application-thereof-dt20081211ptan20080304063.php Fri, 19 Dec 2008 00:09:43 -0800 An overlay mark is described, wherein the overlay mark is used for checking the alignment accuracy between a lower layer defined by two exposure steps and a lithography process for defining an upper layer, including a part of the lower layer and a photoresist patter. The part of the lower... http://www.freshpatents.com/Rail-sensing-apparatus-method-dt20081211ptan20080304065.php Fri, 19 Dec 2008 00:09:43 -0800 A rail sensing and analysis system utilizes a laser sensor 105, 107 to detect displacement of a rail 102, 104 resulting from loads imposed by a passing rail vehicle. Vertical and/or lateral displacements/loads may be sensed. Signatures in the resulting signals are indicative of useful information about the rail vehicle;... http://www.freshpatents.com/Method-for-measuring-the-concentration-of-a-gas-component-in-a-measuring-gas-dt20081211ptan20080304066.php Fri, 19 Dec 2008 00:09:43 -0800 There is described a method for measuring a concentration of a gas component in a measuring gas, wherein the light of a wavelength tunable light source is passed along a single optical path through a measuring volume containing the measuring gas and a reference cell containing a reference gas to... http://www.freshpatents.com/Smoke-detector-dt20081211ptan20080304067.php Fri, 19 Dec 2008 00:09:43 -0800 The detector further comprises at least one mask disposed adjacent to the reflector, the mask being suitable for selecting those light beams that, at the inlet of said mask, have emission directions lying in a predetermined angular range.... http://www.freshpatents.com/Biochip-production-method-biochip-biochip-analysis-apparatus-and-biochip-analysis-method-dt20081211ptan20080304068.php Fri, 19 Dec 2008 00:09:43 -0800 As described above, the novel biochip that is useful for infrared reflection absorption spectroscopy analysis, the biochip analysis apparatus incorporating the biochip, and the biochip analysis method are provided. A biochip to be used for infrared reflection absorption spectroscopy analysis, which is obtainable by forming a metallic layer and an active... http://www.freshpatents.com/Bi-directional-reflectance-distribution-measuring-instrument-dt20081211ptan20080304070.php Fri, 19 Dec 2008 00:09:43 -0800 The invention concerns a bidirectional reflectance distribution meter having a light source which illuminates a sample using pre-determinable elevation and a light receiver, which can be moved relative to the light source in order to receive light from the sample. To this end, it has been designed that the light... http://www.freshpatents.com/Systems-and-methods-for-inspecting-a-specimen-with-light-at-varying-power-levels-dt20081211ptan20080304069.php Fri, 19 Dec 2008 00:09:43 -0800 Systems and methods for inspecting a specimen with light at varying power levels are provided. One system configured to inspect a specimen includes a light source configured to generate light. The system also includes a power attenuator subsystem configured to alter a power level of the light directed to the... http://www.freshpatents.com/Interferometric-system-for-the-use-of-special-purpose-optical-systems-dt20081211ptan20080304071.php Fri, 19 Dec 2008 00:09:43 -0800 An interferometric system which includes an illumination arm having a light source and an illumination optical system for forming an illumination beam path; an object arm having a special-purpose optical system for measuring an object for the purpose of forming an imaging beam path; a reference arm having an adjusting... http://www.freshpatents.com/Method-and-apparatus-for-conjugate-quadrature-interferometric-detection-of-an-immunoassay-dt20081211ptan20080304073.php Fri, 19 Dec 2008 00:09:43 -0800 A detection system for detecting target material is provided. The system comprises a photonic structure having a reflectance-band and associated side bands; an illumination source for illuminating at a wavelength in at least one of an edge of the reflectance-band and the side bands of the photonic structure and for... http://www.freshpatents.com/Optical-sensing-devices-with-spr-sensors-based-on-differential-phase-interrogation-and-measuring-method-using-the-same-dt20081211ptan20080304072.php Fri, 19 Dec 2008 00:09:43 -0800 Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe... http://www.freshpatents.com/Optical-catheter-configurations-combining-raman-spectroscopy-with-optical-fiber-based-low-coherence-reflectometry-dt20081211ptan20080304074.php Fri, 19 Dec 2008 00:09:43 -0800 The present invention provides apparatuses and methods for sample analysis, such as tissue analysis, that integrate high wavenumber (HW) Raman spectroscopy for chemical composition analysis and optical coherence tomography (OCT) to provide depth and morphological information. The invention also provides side-viewing optical probes that are based on a single double... http://www.freshpatents.com/Interferometer-for-optically-measuring-an-object-dt20081211ptan20080304075.php Fri, 19 Dec 2008 00:09:43 -0800 An interferometer for optically measuring an object (10), including a light source (1), at least one beam splitter (2) and at least one detector (12a, 12b), with the beam splitter being arranged in the beam path of the light source such that a light beam created by the light source... http://www.freshpatents.com/Systems-and-methods-for-packaging-and-mounting-readout-and-laser-intensity-monitor-sensors-dt20081211ptan20080304076.php Fri, 19 Dec 2008 00:09:43 -0800 Methods and apparatus for applying sensors to a ring laser gyro. An example apparatus includes a housing having a cavity, a laser intensity monitor (LIM) sensor mechanically and electrically connected within the cavity of the housing, and a readout sensor mechanically and electrically connected within the cavity of the housing.... http://www.freshpatents.com/Cyclic-error-compensation-in-interferometry-systems-dt20081211ptan20080304077.php Fri, 19 Dec 2008 00:09:43 -0800 A first portion of a beam including a first frequency component is directed along a first path. A second portion of the beam is frequency shifted to generate a shifted beam that includes a second frequency component different from the first frequency component and one or more spurious frequency components... http://www.freshpatents.com/Method-and-apparatus-for-optically-analyzing-a-surface-dt20081211ptan20080304078.php Fri, 19 Dec 2008 00:09:43 -0800 In one embodiment, a system to measure defects on a surface of a wafer and an edge of the wafer using a single tool comprises a radial motor to move an optical head in a radial direction to detect defects at locations displaced from the edge of the wafer, and... http://www.freshpatents.com/Displacement-measurement-sensor-head-and-system-having-measurement-sub-beams-comprising-zeroth-order-and-first-order-diffraction-components-dt20081211ptan20080304079.php Fri, 19 Dec 2008 00:09:43 -0800 A sensor head for use with a measurement grating is described. The sensor head comprises: a splitter grating configured to split a light beam into first and second measurement beams; a first retroreflector configured to retroreflect the first and second measurement beams toward the measurement grating; and a second retroreflector... http://www.freshpatents.com/Aspheric-lens-surface-decenter-measuring-method-and-apparatus-dt20081211ptan20080304080.php Fri, 19 Dec 2008 00:09:43 -0800 A relationship between surface decenter of a lens 1 under test and surface-decenter comatic aberration and a relationship between surface tilt of the lens 1 under test and surface-tilt comatic aberration are calculated by computer simulation. The surface tilt of the lens 1 under test is calculated by measuring a... http://www.freshpatents.com/Acquisition-of-surface-normal-maps-from-spherical-gradient-illumination-dt20081211ptan20080304081.php Fri, 19 Dec 2008 00:09:43 -0800 An apparatus for generating a surface normal map of an object may include a plurality of light sources having intensities that are controllable so as to generate one or more gradient illumination patterns. The light sources are configured and arranged to illuminate the surface of the object with the gradient... http://www.freshpatents.com/Method-and-apparatus-for-noncontact-relative-rail-displacement-track-modulus-and-stiffness-measurement-by-a-moving-rail-vehicle-dt20081211ptan20080304083.php Fri, 19 Dec 2008 00:09:43 -0800 An on-board, noncontact measurement system and method is disclosed for measuring track quality, vertical track stiffness and vertical track modulus for a portion of track underlying the rail vehicle. The system comprises first and second optical emitters mounted to the vehicle and configured to emit beams of light that are... http://www.freshpatents.com/Multi-position-detecting-method-and-area-detecting-method-in-infrared-rays-type-touch-screen-dt20081211ptan20080304084.php Fri, 19 Dec 2008 00:09:43 -0800 A method for detecting the coordinates of multiple touching objects on an infrared touch screen without errors and a method for detecting the area of the touched spot are provided. The coordinate detection method includes measuring and storing the maximum received level of a pair of infrared emitting and receiving... http://www.freshpatents.com/Optical-sensor-system-on-an-apparatus-for-treating-liquids--dt20081211ptan20080304082.php Fri, 19 Dec 2008 00:09:43 -0800 An optical sensor system on an apparatus for treating liquids, with a device for projecting light to at least one illumination position in space, at least one device for imaging the at least one illumination position on at least one photo detector in order to supply a measurement signal depending... http://www.freshpatents.com/Device-for-inspecting-countersunk-holes-dt20081211ptan20080304085.php Fri, 19 Dec 2008 00:09:43 -0800 The invention is a non contact laser inspection self centering device to inspect the counter sink portion of a counter sunk fastener hole on a surface. In detail, the self centering and seating device includes a combination laser transmitter and receiver for transmitting a laser bean across a surface and...